11V_1,Aef
Approved F ase 2001/03/07 : CIA-RDP96-00792ROO0500490003-7 1*1111.L.
Tuesday
 42 M-11AP
January 13, 1987
Sovie t s Abstracts Publication
Pubhsht,d by
FOREIGN TECHNOLOGY DIVISION
Author: Savel'yev, A.
62L" Mu
INDUCUR
.S. I
Primary source: Leninskoye znamya,
December 17, 1986, No. 286 (20306),
p. 1, col. 2
Extract: The precision and reli-
ability of elements of electronic
devices and systems play a decisive
role in determining their perform-
ance. Processes that take place in
semiconductors, however, are such
that making and inspecting semicon-
duc.tors require verv sharp electron-
ic leyes' and a very shrewd elec-
tronic 'brain.,
A group of scien--ists and design-
ers of the US@R Academy of Sciences'
Institute of,4
El'e-.0 @, and
, ;Lcs_._..(IRE) under the direc-
tion of academician MW,,,._A@__.Gu1Zaxpv-
and Doctor of PhysiE-al-Hathematical'
Sciences A. G. Zhdan, head of a
laboratory, has developed,&a__ajLtA_-
ia"eA__Ay s t. e'PL 0 e_te _p-rocess-
i,1Rg,_,qf expe ent ata r e.!@7
t r.Q.,A&q
_py o f e I e C.;jjWl"L"91, ( de -
fects) o i_-;_.,MMw
n semiconductor--dielec-
tric' boundaries (ASPOED), and also
an automated compley for inspecting
and diagnosing elect-onic materials
and products using e.ectrophysical
methods.
. What benefits do hese develop-
ments offer?
THE ASPOED system seemingly
'filters out' useful data from the
mass of information from experi-
inents, and with it the accuracy of
determining characteristics of de-
fects increases by more than 10
times. This gre@,tly increases the
understanding of the nature of de-
fects, and as a practical benefit
it makes it possible to develop new
instruments for -more reliable con-
trol of processes for production of
microelec-tronic devices.
The automated complex will help
to deter-mine and control character-
istics of semiconductor materials,-
devices andmicrostructures using
various electrophysical methods


which traditionally are used in
semiconductor physics research.
This complex is needed today by
many researchlaboratories, and
especially by industry laboratories.
It will help to improve substantially
the control of processes and to
identify causes of defects. The com-
plex has been-made ready for series
production, and the rest is up to
interested clients'.
Author: Mokhorov. E., correspondent
(Kaluga)
Title: AUTO ELECTRONICS ORGANIZATIONS
SEEKING WAYS THROUGH BUREAUCRACY
Primary source: Sotsialisticheskaya
industriya, December 30, 1986, No.
299 (5290), p. 1, cols. 1-3
Extract: In the near future, micro-
processor-based devices which exist
now only in the fo-rm of a single
prototype will control the ignition
systems of passenger cars and trucks
(continued next column)
Approved For Release 2001/03/07: CIA-14yPui-80621MW606003-7